几种常用芯片检测的设计与实现.rar

几种常用芯片检测的设计与实现

摘 要

芯片作为计算机基本输入输出的程序、系统设置信息、开机上电自检程序和系统启动自举程序的工具，为计算机提供最底层的、最直接的硬件设置和控制。为确保安全性和稳定性，避免不必要的损失，其检测就显得尤为重要。本文介绍了常用芯片检测系统的一种设计方案，其基本原理是通过数据比较来确定芯片的好坏。本系统通过对时间频率的测量，确定定时计数器的好与否；通过给标准8255送入数据，再将标准8255输出的数据送给待测芯片，经数据比较判断常用芯片好坏；通过对8255输入数据，对244和374进行判断；通过ADC0809来测量标准电压，并测量0832输出的标准电压来检测AD和DA模块。操作时，将待测芯片对应键按下，经过系统测试后，以数码管来显示芯片是否能够正常工作。其优点是简单实用、操作方便、经济效益，可以迅速的检测出芯片的工作是否正常。文中阐述了设计思路，同时也给出了相应的原理图和流程图。

关键词：检测;芯片;数据比较;测量

Abstract

Chip as a tool of the computer's basic input-output procedures, system setup information, Power on Self Test on the boot process and system bootstrap program to start, to provide the bottom, the most direct control and the hardware settings of the computer. To ensure the security and stability, to avoid unnecessary losses and its detection seem particularly important. In this dissertation, I have introduced a design of common chip detection system and its basic principle is that the quality of chips can be determined through the data comparison. The system define timing counter whether good or not by time-frequency measurements; by sending data to the normal 8255, then transferring the output datum to the chip needing check, judge common chip whether good or not by data comparison; judge 244 and 374 according to input the data to 8255; measure the standard voltage that come through ADC0809, and detect the AD and DA modules by measuring the standard of 0832 output voltage. While operating, press the corresponding button of the chip which waiting for measurement, after the system measurement, Chip can work properly or not will be showed by Digital tube. The advantage is simple and practical, easy to operate, cost-effective, can be quickly detected the normal work of the chip. The paper described the design ideas, as well as the corresponding schematic diagram and flow chart.

Keywords: detection; chip; data comparison; measurement

目 录

0  前言……………………………………………………………………………1
1  AT89C51单片机的功能简要介绍…………………………………………2
1.1AT89C51简介…………………………………………………………………2
1.2  AT89C51的的引脚功能…………………………………………………2
1.3  AT89C51的定时/计数器…………………………………………………3
1.4 串行通信……………………………………………………………………5
2  74LS138译码器的简要介……………………………………………………7
2.1  74LS138工作原理………………………………………………………7
2.2  74LS138引脚功能……………………………………………………7
2.3  74LS138译码器真值表…………………………………………………7
3  地址锁存器74LS373的简要介绍…………………………………9
3.1  74LS373工作原理………………………………………………………9
3.2  74LS373引脚说明……………………………………………………9
3.3  74LS373内部结构……………………………………………………9
3.4  74LS373的优点……………………………………………………10
4  芯片8255的检测…………………………………………………………11
4.1  内部结构和引脚功能…………………………………………………11
4.2  8255控制字和状态字……………………………………………………13
4.3  芯片8255的检测方法…………………………………………………14
4.4  芯片8255的电路原理图………………………………………………14
4.5  芯片8255的测程序流程图……………………………………………15
4.6  芯片8255的检测程序…………………………………………………16
5  芯片74ls244的检测…………………………………………………17
5.1  74LS244特性………………………………………………………17
5.2  74LS244的检测方法……………………………………………17
5.3  74LS244的检测电路图………………………………………………17
5.4  74LS244的检测程序流程图………………………………18
5.5  74LS244的检测程序………………………………………………18
6  芯片74LS374的检测的检测……………………………………………20
6.1  74LS374的特性……………………………………………………20
6.2  74LS374的检测方法………………………………………………20
6.3  74LS374的检测电路图…………………………………………20
6.4  74LS374的检测流程图…………………………………………………21
6.5  74LS374的检测程序……………………………………………22
7  芯片ADC0809的检测…………………………………………………24
7.1  ADC0809内部结构……………………………………………………24
7.2  0809的检测方法………………………………………………………25
7.3  0809的检测电路图………………………………………………………25
7.4  0809的检测程序流程图…………………………………………………26
7.5  0809的检测程序……………………………………………………26
8  芯片0832的检测……………………………………………………29
8.1  0832的内部特性……………………………………………………29
8.2  0832的检测方法……………………………………………………30
8.3  0832的检测电路原理图…………………………………………………31
8.4  0832的检测流程图……………………………………………………31
8.5  0832的检测程序……………………………………………………32
9  芯片8253的检测……………………………………………………35
9.1  8253基本结构和功能……………………………………………………35
9.2  8253的编程说明……………………………………………………36
9.3  8253的检测方法……………………………………………………38
9.4  8253的检测电路原理图…………………………………………………38
9.5  8253的检测程序流程图…………………………………………………39
9.6  8253的检测程序…………………………………………………39
10  技术经济分析………………………………………………………………42
11  结论…………………………………………………………………………43
致谢…………………………………………………………………………44
参考文献…………………………………………………………………………45
附录A译文…………………………………………………………46
附录B 外文文献……………………………………………………………57