基于ds18b20分组式温度测试系统设计_外文翻译.doc
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基于ds18b20分组式温度测试系统设计_外文翻译,摘要当用于多点测温时，所有的ds18b20传感器都连接在单片机的某根总线上，采用轮流采集温度数据的方式。当系统有多个传感器时，单片机用于处理温度数据的时间就会明显延长，从而导致测温系统周期增长。在本文中，采取对ds18b20合理的分组的方法，并在软件上采取一定措施，从而明显的提高交替检测速度。关键词：ds18b20分组...
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摘要
当用于多点测温时，所有的DS18B20传感器都连接在单片机的某根总线上，采用轮流采集温度数据的方式。当系统有多个传感器时，单片机用于处理温度数据的时间就会明显延长，从而导致测温系统周期增长。在本文中，采取对DS18B20合理的分组的方法，并在软件上采取一定措施，从而明显的提高交替检测速度。
关键词：DS18B20分组 ；温度测试；交替检测时间
Abstract
All the DS18B20 sensors, used for the multipoint test temperature, are connected with MCU on one of IO bus, and temperature data are collected by turns. If the system has a large amount of sensors, the time of MCU used in processing the temperature data is obviously prolonged, so the cycle of alternate test gets longer. In this paper, a new method that DS18B20 are rationally grouped is presented, and some measures are taken in software; as a result, the speed of alternate test advances distinctly.
Key words- DS18B20 Group ,temperature test, time spent on the alternate test
当用于多点测温时，所有的DS18B20传感器都连接在单片机的某根总线上，采用轮流采集温度数据的方式。当系统有多个传感器时，单片机用于处理温度数据的时间就会明显延长，从而导致测温系统周期增长。在本文中，采取对DS18B20合理的分组的方法，并在软件上采取一定措施，从而明显的提高交替检测速度。
关键词：DS18B20分组 ；温度测试；交替检测时间
Abstract
All the DS18B20 sensors, used for the multipoint test temperature, are connected with MCU on one of IO bus, and temperature data are collected by turns. If the system has a large amount of sensors, the time of MCU used in processing the temperature data is obviously prolonged, so the cycle of alternate test gets longer. In this paper, a new method that DS18B20 are rationally grouped is presented, and some measures are taken in software; as a result, the speed of alternate test advances distinctly.
Key words- DS18B20 Group ,temperature test, time spent on the alternate test
