基于蚁群算法的测试集优化.doc
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基于蚁群算法的测试集优化,页数：6字数：5640摘要: 电路集成度和复杂度的不断增加使电路故障诊断变得愈加困难。其中，测试集优化问题是电路故障诊断的关键问题之一。本文以新颖的蚁群算法为基础，较好地解决了测试集的优化问题，并通过实验证明了该算法的良好性能。关键词：蚁群算法，测试集优化，故障诊断a test set opti...
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基于蚁群算法的测试集优化
页数：6 字数：5640
摘要: 电路集成度和复杂度的不断增加使电路故障诊断变得愈加困难。其中，测试集优化问题是电路故障诊断的关键问题之一。本文以新颖的蚁群算法为基础，较好地解决了测试集的优化问题，并通过实验证明了该算法的良好性能。
关键词：蚁群算法，测试集优化，故障诊断
A Test Set Optimization Method Based On Ant Algorithm
Abstract: The increase of digital circuit integrity and complexity has made fault diagnosis of circuits more and more difficult. The scale of test set has become very large because of redundancy, which costs lots of time and memory unnecessarily. It is important to acquire optimal test set for test application. Test set optimization, which can eliminate the redundancy, is one of key problems in fault diagnosis of digital circuits. Ant colony optimization
页数：6 字数：5640
摘要: 电路集成度和复杂度的不断增加使电路故障诊断变得愈加困难。其中，测试集优化问题是电路故障诊断的关键问题之一。本文以新颖的蚁群算法为基础，较好地解决了测试集的优化问题，并通过实验证明了该算法的良好性能。
关键词：蚁群算法，测试集优化，故障诊断
A Test Set Optimization Method Based On Ant Algorithm
Abstract: The increase of digital circuit integrity and complexity has made fault diagnosis of circuits more and more difficult. The scale of test set has become very large because of redundancy, which costs lots of time and memory unnecessarily. It is important to acquire optimal test set for test application. Test set optimization, which can eliminate the redundancy, is one of key problems in fault diagnosis of digital circuits. Ant colony optimization
